FREE WEBINAR !! FREE E-CERT!!
SEMILAB WEBINAR - MASTERING SPECTROSCOPIC ELLIPSOMETRY
Advanced Ellipsometry for Thin Film and Epitaxy Growth Research
📅 Date: 9 June 2026
🕒 Time: 15:00 – 17:30 (UTC/GMT +8)
💻 Platform: Online Webinar
This webinar will introduce the fundamentals and applications of spectroscopic ellipsometry for thin film and epitaxy characterization, including practical insights into measurement workflows, multilayer analysis, and real research applications.
The session is especially relevant for researchers and engineers involved in:
* Thin film characterization
* Semiconductor and epitaxy research
* Surface and interface analysis
* Optical material characterization
Please register here: https://docs.google.com/forms/d/e/1FAIpQLSe6yCER5UzNiQIoL3utSRDW8frb1o7PfW8fHq87LKQuovxesA/viewform
The access link will be shared after registration.
We would greatly appreciate your support in sharing this invitation with researchers, students, and colleagues who may be interested in this topic.
Thank you and we look forward to your participation.
